3D Sensing Defining Requirements for Electrical Test of Optical Devices
3D sensing augments a camera's object & facial recognition.
3D sensing is a depth sensing technology that augments camera capabilities for facial and object recognition in augmented reality, gaming, autonomous driving and a wide range of applications.
- One way to sense 3D is using structured light. Coherent infrared light is transmitted onto an object with a structured pattern. The reflected light can be decoded to construct a 3D image.
- Another way to sense 3D is to use Time of Flight (ToF). A light source transmits a series of infrared light and the photon phase difference to the light bounced off an object is used to sense the proximity of an object.
Diode-based optical devices enable 3D sensing.
Diode-based devices such as laser diodes, high brightness LEDs (HBLED), and photodiodes (PD) are key optical devices that enable 3D sensing.
- Laser diodes are capable of outputting a narrow and coherent light beam. Two common types of laser diodes are edge emitter laser (EEL) and the fast-growing VCSEL (vertical cavity surface emitting laser). VCSEL combines the advantage of low cost manufacturability, optical efficiency, temperature stability, and large 2D arrays for increased power. EEL operates at a higher frequency that can travel hundreds of miles without loss in a fiber medium commonly for optical communication.
- HBLEDs or LEDs disperse incoherent light in a wide pattern. They are the most efficient source of high quality white light, hence great for illumination. Efficiency droop, limited modulation capability, and resolution make them only suitable for some applications.
- PDs detect and convert light into current. Very sensitive instruments for low PD current measurement are required to characterize the full range light intensity of the light source properly.
Keithley instruments perform electrical testing on diode-based devices.
Wavelength stability over the entire operating temperature of these devices is critical to maintaining precision and minimize noise in received signals. Electrical efficiency measurement through precision trigger and synchronization of pulse width and duty cycle further optimize the required intensity and resolution of illumination. These directly impact the heat dissipation, power consumption, and battery life of the end system.
Keithley has an extensive portfolio of instruments for electrical tests, including light intensity, forward voltage, lasing threshold current, quantum efficiency, dark current, the presence of “kink” or kink test, slope efficiency, thermistor resistance, temperature, capacitance, and the full spectrum of L-I-V pulse testing of laser diodes and HBLEDs.
Learn from Keithley experts.
The application engineers at Keithley offer white papers, application notes and blogs on these topics and more.
Opto/Laser Diode Testing
Watch our webinar and learn 10 test methods for a variety of devices, including those used for 3D sensing.
Laser Diode Array TestingDOWNLOAD NOW »
Get our application note, Enhancing Trigger Synchronization for High Volume Production Testing of VCSELs.
Measuring Laser Diode Optical Power with an Integrating Sphere
This white paper offers an overview on using an integrating sphere to measure the optical power of radiant sources in a production environment.
Pulse Testing of Laser Diode
This white paper discusses measurement challenges and test configuration considerations assoicated with pulse testing of laser diodes.
High Throughput DC Production Testing of Laser Diode Modules and VCSELs
This application note offers techniques to increase throughput, maximize synchronization, and reduce overhead in laser diode production test.
Series 2600B SMU
DMM7510 7½-Digit Graphical Sampling Multimeter
2510 and 2510-AT TEC Instruments