IN
Current Site
×
IN

Select Region to customize your experience:

Toggle Menu
IN
Current Site
×
IN

Select Region to customize your experience:

Contact us

Live Chat with Tek representatives. Available 9:30 AM - 5:30 PM IST

Call

Call us at

Available 9:30 AM – 5:30 PM (IST) Business Days

Download

Download Manuals, Datasheets, Software and more:

DOWNLOAD TYPE
MODEL or KEYWORD

Pulse I-V Characterization of Non-Volatile Memory Technologies


This application note provides a brief history of non-volatile memory (NVM), an overview of the test parameters required for electrical characterization of NVM materials and devices, and a discussion of emerging test requirements.  It also provides an overview of the NVM projects, tests, and parameters for testing floating gate flash, phase-change cell, ferro-electric cell devices, and resistive memory.