Wafer Level Reliability Testing with the Keithley Model 4200A-SCS Parameter Analyzer

Evolving design scales and new materials are making wafer level reliability testing more critical than ever. This is also driving the demand for reliability testing and modeling much further upstream, especially into the R&D process. Instrumentmanufacturers are responding with new reliability test tools that are faster, more sensitive, and highly flexible to help drive down the cost of testing and shorten the time to market.  This application note discusses how Keithley’s 4200A-SCS Parameter Analyzer and package options provide the hardware and software necessary for fast and complete device characterization and reliability testing.

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