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DPO70000SX ATI performance oscilloscope

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Got Jitter? Diagnosing Power Integrity and Signal Integrity Problems

Are the bit errors in your data caused by the power supply or sources inside the digital channel? Let's end the dispute.

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SiC/GaN Components: 5 Key Tests

Learn techniques for high power characterization of Silicon Carbide (SiC) and Gallium Nitride (GaN) components.