Jitter Measurement and Timing Analysis

Understanding timing jitter has become a mandatory part of high-speed communications system design as today’s serial data standards require extensive jitter compliance tests.  Tektronix' comprehensive test instrumentation portfolio enables you to meet your design goals and compliance requirements – fast.

  • TekScope AnywhereTM Waveform Analysis:  Users now have the flexibility to perform timing, eye, and jitter analysis outside the lab that can easily be shared between team members in a networked environment.
  • 80SJNB Jitter, Timing, and SDLA Visualizer Analysis for Sampling Oscilloscopes: 80SJNB is an all-purpose tool that enables engineers to specify a de-embed filter, Time Domain Waveform or S-Parameter for channel embedding. 80SJNB also performs timing, noise and mask testing analysis to get a 3-D view of the eye diagram performance for deep, accurate evaluation on signals with speeds beyond 50GHz.


Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester

Using Six Sigma for citical insight.

Understanding and Characterizing Timing Jitter Primer

Timing jitter is the unwelcome companion of all electrical systems that use voltage transitions to represent timing information. This paper focuses primarily on jitter in electrical systems.

Dual-Dirac+ Scope Histograms and BERTScan Measurements

Introduction to Dual-Dirac.

Evaluating Stress Components using BER-Based Jitter Measurements

Self-verified jitter measurements using a BER-based Jitter Peak measurement.

Paper presented 8/9/05 at the T11.2 FC-MSQS Ad Hoc Meeting: Impact of Noise on BER Estimation
Comparing Jitter Using a BERTScope® Bit Error Rate Testing

Comparison of DCD and F/2 Jitter.

Bridging the Gap Between BER and Eye Diagrams — A BER Contour Tutorial

Introduction to the BER Contour measurement.

Anatomy of an Eye Diagram

Description of an eye diagram, how it is constructed, and common method for generating one.

Characterize Phase-Locked Loop Systems Using Real Time Oscilloscopes

This application note introduces the operating principles of the PLL as well as describes how to accomplish typical PLL characterization tests using a real-time oscilloscope.

Clock Recovery’s Impact on Test and Measurement

This application note discusses the outside influences that can disturb the relationship between data and how it is clocked.

Enjoy the flexibility to perform analysis tasks including timing, eye and jitter…

Jitter Fundamentals

View this recorded webinar to get a solid overview of jitter components as well as jitter characterization and visualization. Learn how to control Jitter during system design and improve timing margins for today’s high-speed systems.

Enabling PAM4 for Emerging Requirements in Data Communications
Advanced Jitter and Noise Analysis new webinar that covers advances in the popular DPOJET timing & jitter analysis toolset
How to Address Your Toughest Serial Bus Design Challenges with EDA and Measurement Correlation

This Tektronix webinar will teach engineers how to use modeling tools to correlate simulations with high-speed physical layer measurements on Serial Bus Standards using the DPO/MSO70000 Series Oscilloscopes.

Choosing the Right Platform for Jitter Measurements

How to Choose the Right Platform for Jitter Measurements.


Download Manuals, Datasheets, Software and more:

Go to top