Keithley 4200A-SCS Parameter Analyzer

Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.

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DC Current-Voltage
(I-V) Range

10 aA - 1A
0.2 µV - 210 V

Capacitance-Voltage
(C-V) Range

1 kHz - 10 MHz
± 30V DC bias

Pulsed I-V
Range

±40 V (80 V p-p), ±800 mA
200 MSa/sec, 5 ns sampling rate

 

Keithley 4200A-SCS Parameter Analyzer

Parametric insight, fast and clear.

Front view of 4200A-SCS and 4200A-CVIV performing a CV sweep

Making connections to your bold discoveries has never been easier. The 4200A-SCS Parameter Analyzer reduces characterization complexity and test setup by up to 50%, providing clear, uncompromised measurement and analysis capability. Plus, embedded measurement expertise—an industry first—provides test guidance and gives you supreme confidence in your results.

Highlights

  • Built-in measurement videos in English, Chinese, Japanese, and Korean
  • Jump start your testing with hundreds of user-modifiable application tests
  • Automated real-time parameter extraction, data graphing, arithmetic functions

Measure. Switch. Repeat.

Keithley 4200A-CVIV multi-switch on a wafer probe station

The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. Unlike competing products, the four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.

Highlights

  • Move C-V measurement to any device terminal without re-cabling
  • User-configurable for low current capability
  • Personalize the names of output channels
  • View real-time test status

Stable low current measurements for I-V Characterization

With the 4201-SMU and 4211-SMU modules you can achieve stable low current measurements in a high capacitance system. With four models of source measure unit (SMU) to choose from, the 4200A-SCS can be customized to meet all of your I-V measurement needs. By offering field Installable Units and optional preamplifier modules, Keithley makes sure that you can make the most accurate low current measurements with little to no downtime.

Highlights

  • Add an SMU without an sending the instrument back to the factory
  • Make femptoamp measurements
  • Up to 9 SMU channels
  • Optimized for long cables or large chucks

Integrated solution with analytical probers and cryogenic controllers.

Keithley 4200A-SCS parameter analyzer in front of wafer probe station

The 4200A-SCS Parameter Analyzer supports many manual and semi-automated wafer probers and cryogenic temperature controllers, including MPI Cascade MicroTech, Lucas Labs/Signatone, MicroManipulator, Wentworth Laboratories, LakeShore Model 336 cryogenic temperature controller.

Highlights

  • "Point and click" test sequencing
  • "Manual" prober mode tests prober functionality
  • Fake prober mode enables debugging without removing commands

Cut Costs and Protect Your Investment

Protect your investment with a Keithley Care plan

Keithley Care plans provide fast, high-quality services at a fraction of the cost of on-demand service events. You are one click or phone call away from obtaining repair coverage - no quotes, purchase orders, or approval delays.

Learn More

 

Datasheet Model Description Pricing
View Datasheet 4200A-SCS-PK1
High Resolution IV
210V/100mA, 0.1 fA resolution
For two- and three-terminal devices, MOSFET, CMOS characterization Package 4200A-SCS-PK1 includes:
  • 4200A-SCS parameter analyzer
  • (2) 4200-SMU Module
  • (1) 4200-PA Preamp
  • (1) 8101-PIV Test fixture with sample devices
Request a Quote
View Datasheet 4200A-SCS-PK2
High Resolution IV & CV
210V/100mA, 0.1 fA resolution, 1kHz - 10MHz
For high κ dielectric, deep submicron CMOS characterization Package 4200A-SCS-PK2 includes:
  • 4200A-SCS parameter analyzer
  • (2) 4200-SMU Module
  • (1) 4200-PA Preamp
  • (1) 4210-CVU Capacitance-Voltage Module
  • (1) 8101-PIV Test fixture with sample devices
Request a Quote
View Datasheet 4200A-SCS-PK3
High Resolution and Power IV & CV
210V/1A, 0.1 fA resolution, 1kHz - 10MHz
For power devices, high κ dielectric, deep submicron CMOS device characterization Package 4200A-SCS-PK3 includes:
  • 4200A-SCS parameter analyzer
  • (2) 4200-SMU Module
  • (2) 4210-SMU
  • (2) 4200-PA Preamp
  • (1) 4210-CVU Capacitance-Voltage Module
  • (1) 8101-PIV Test fixture with sample devices
Request a Quote
View Datasheet 4200-BTI-A
Ultra-fast NBTI/PBTI
For sophisticated NBTI and PBTI measurements on leading-edge silicon CMOS technology Package 4200-BTI-A includes:
  • (1) 4225-PMU Ultra-Fast I-V Module
  • (2) 4225-RPM Remote Preamplifier/Switch Modules
  • Automated Characterization Suite (ACS) Software
  • Ultra-Fast BTI Test Project Module
  • Cabling
Request a Quote

Semiconductor Reliability

Reliability testing performed with the 4225-PMU pulse module

Perform complex reliability tests while letting the 4200A-SCS take care of the complexities. Included projects like Hot Carrier Injection Degradation (HCI) and Negative Bias Temperature Instability (NBTI) give you a jump start on device analysis. For larger labs, the 4200-BTI package includes site mapping and automatic prober control with Keithley’s ACS software.

Highlights

  • Combine DC I-V, C-V, and pulse measurements in one set of tests
  • Included support for many probe stations and external instruments
  • Easy to use cycling system allows repeat measurements without coding

C-V Measurement for High Impedance Applications

Very Low Frequency C-V Sweep performed on a MOSCAP device

Use Keithley’s custom Very Low Frequency C-V Technique to analyze the capacitance of your high resistance sample. This technique is performed using only source measure unit (SMU) instruments but can be combined with a 4210-CVU to perform higher frequency measurements as well.

Highlights

  • .01 to 10 Hz frequency range with sensitivity of 1 pF to 10 nF
  • 3½-digit typical resolution, minimum typical of 10 fF

Non-volatile Memory

PUND memory test sequence performed with the 4225-PMU pulse module

Put your new technologies to the test with thorough pulsed I-V characterization. The 4200A-SCS comes with support and ready-to-run tests for the latest in NVRAM technologies from floating gate flash to ReRAM and FeRAM. Dual sourcing and measuring capabilities in current and voltage allow both transient and I-V domain characterization.

Testing when using Long Cables or Capacitive Fixtures

Vg-Id test performed with the 4201-SMU module

Use 4201 or 4211-SMUs when making tests requires very long cabling or fixtures with higher capacitances. These SMUs are ideal for connecting to LCD test stations, probers, switch matrices or any other large or complicated tester. Field installable versions allow you to add capacity without returning the unit to a service center.

Nanoscale Device Characterization

Carbon Nanotube FET family of curves

The integrated instrument capabilities of the 4200A-SCS simplify the measurement requirements in developing nanoscale electronics such as carbon nanotubes. Start your investigations from a preconfigured test project and expand your work from there. A pulsed source mode for SMUs helps reduce overheating problems can be combined with low voltage C-V and ultra-fast pulsed DC measurements in seconds.

Resistivity of Materials

Resistivity measurements for material science performed with a colinear four-point probe

Use a 4200A-SCS with integrated SMUs to easily measure resistivity using a four-point collinear probe or van der Pauw method. Included tests perform repetitive van der Pauw calculations automatically, saving you valuable research time. A maximum current resolution of 10aA and input impedance of >10­­­­16 ohms give you more accurate and precise results.

MOSFET Characterization

MOSFET Threshold Voltage measurement taken on a 4200A-SCS parameter analyzer

The 4200A-SCS can hold all the instruments necessary for full characterization of MOS devices through component or on-wafer testing. Included tests and projects solve for oxide thickness of a MOSCap, threshold voltages, doping concentration, mobile ion concentration, and more. All these tests can be run at the touch of a button from a single instrument box.

Data Sheet Module Description Configure and Quote
4200A-CVIV I-V/C-V MULTI-SWITCH MODULE Configure & Quote
4201-SMU Medium Power Source Measure Unit for High-Capacitance Setups Configure & Quote
4211-SMU High Power Source Measure Unit for High-Capacitance Setups Configure & Quote
4201-SMU-R Field Installable Medium Power Source Measure Unit for High-Capacitance Setups Configure & Quote
4211-SMU-R Field Installable High Power Source Measure Unit for High-Capacitance Setups Configure & Quote
4200-SMU MEDIUM POWER SOURCE-MEASURE UNIT Configure & Quote
4210-SMU HIGH POWER SOURCE-MEASURE UNIT Configure & Quote
4200-SMU-R FIELD REPLACEABLE MPSMU Configure & Quote
4210-SMU-R FIELD REPLACEABLE HPSMU Configure & Quote
4200-PA REMOTE PREAMPLIFIER MODULE Configure & Quote
4210-CVU CAPACITANCE-VOLTAGE UNIT Configure & Quote
4220-PGU HIGH VOLTAGE PULSE GENERATOR UNIT Configure & Quote
4225-PMU ULTRA-FAST PULSE MEASURE UNIT Configure & Quote
4225-RPM REMOTE PREAMPLIFIER/SWITCH MODULE Configure & Quote
4200-BTI-A ULTRA FAST BTI PKG Configure & Quote
I have lost the device library on the 4200A-SCS, how to get it back?
The best way to get the library back is to re-install Clarius the their system. It’s free from our Tek.com website. Here is the link :https://www.tek.com/software/clarius/1-3
Faq Id247546 15 Jan 2020
Is there a resettable fuse on the interlock circuit for model 4200A-SCS?
Yes, there is a resettable fuse. It takes several minutes to reset, please give it some time.This is discussed on page 4 and 5 of the included application note. Here is a link to the application note on the Tek website: https://www.tek.com/document/a
Faq Id248681 15 Jan 2020
Does Model 4200A-SCS support Model 590-CV meter like the Model 4200-SCS?
The Model 590-CV is a stand alone CV meter and can be controlled from either the 4200A-SCS and 4200-SCS using the KIXI (remote interface software).
Faq Id249356 15 Jan 2020
Does the 4200A-SCS support ICCAP?
Although the 4200ICCAP-6.0 driver is obsolete, the 4200A is ICCAP supported through the KXCI software.  The 4200 drivers in the KXCI software come with ICCAP in them and all KXCI programs for the 4200 are compatible with the 4200A. Note: ICCAP only
Faq Id255351 15 Jan 2020
What is the time required to switch between Pulse IV (4225PMU) and CV (4210ACVU) measurements using the 4225-RPM for the 4200A-SCS?
The RPM eliminates the need to re-cable and increases switching speed between Pulsed IV and CV measurements.  However, we do not specify the switching time for the RPMs in the data sheets. A simple test using a MDO3102 yeided the below approximate s
Faq Id469646 15 Jan 2020
What is included in the 4200A-SCS Windows 10 Upgrade option?
The 4200A-SCS can be upgraded from the Windows 7 operating system to Windows 10. The part number for this upgrade is 4200A-WIN10-UP. This service will provide a USB flash drive containing the upgrade program files and instructions for installing the
Faq Id780921 15 Jan 2020
Do I need to calibrate my instruments separately when I upgrade from the 4200-SCS to a 4200A-SCS mainframe?
No; when the 4200A-MF-UP service is selected, the 4200-SCS is converted to the 4200A-SCS mainframe. This system gains the Clarius software. All supported instrument modules in the original system will be moved to the new, 4200A-SCS mainframe and will
Faq Id780926 15 Jan 2020
4200A-SCS Parameter Analyzer Datasheet

Literature Number: 1KW-60780-5
Datasheet 12 Jan 2020
Ultra Fast Single Pulse Technique for Channel Effective Mobility Measurement
Application Note 26 Dec 2019
SOLUTIONS FOR SCIENTIFIC AND ENGINEERING RESEARCH

Literature Number: 55W_30503_2
Brochure 26 Dec 2019
Safely Using the Interlock on the Keithley Model 4200-SCS
Application Note 26 Dec 2019
Ultra-Fast I-V Applications for the Model 4225-PMU Ultra-Fast I-V Module
Application Note 26 Dec 2019
The Emerging Challenges of Nanotechnology Testing
Technical Article 26 Dec 2019
Advances in Electrical Measurements for Nanotechnology E-Handbook
Rev 3.13
Fact Sheet 26 Dec 2019
ACS Integrated Test System for Lab-Based Automation
Application Note 26 Dec 2019
Pulsed I-V Testing for Components and Semiconductor Devices - Applications Guide
Application Note 26 Dec 2019
Pulse Testing for Nanoscale Devices
Technical Article 26 Dec 2019
Probing Transistors at the Contact Level in Integrated Circuits
Application Note 26 Dec 2019
Making Stable Low Current Measurements with High Test Connection Capacitance Using the 4201-SMU and 4211-SMU
This application note explains the maximum capacitance specifications of an SMU, and describes several applications on which the 4201-SMU and 4211-SMU enables you to make stable low current measurements. The example applications describe include the

Literature Number: 1KW-61609-0
Application Note 26 Dec 2019
Making Optimal Capacitance and AC Impedance Measurements with the 4210-CVU Capacitance Voltage Unit
Capacitance-voltage (C-V) and AC impedance measurements are commonly performed on many types of devices for a wide variety of applications.  This application note describes how to make optimal capacitance measurements using proper measurement techniq

Literature Number: 1KW-61528-0
Application Note 26 Dec 2019
Making Low Current Pulse I-V Measurements
This application note defines ultra-fast I-V, explains the fundamental limits of current measurements as a function of time and measure window, and describes the techniques for making ultra-fast I-V low current measurements.

Literature Number: 1KW-61527-0
Application Note 26 Dec 2019
Making Three-Terminal Capacitance-Voltage Measurements Up to 400 V
This application note explains how the CISS, COSS and CRSS measurements are made using the bias tee capabilities in the 4200A-CVIV Multi-Switch. This application note also shows how the instrument DC output voltage was doubled from 200 V to 400 V for

Literature Number: 1KW-61529-0
Application Note 26 Dec 2019
Making Charge-Pumping Measurements with the Model 4200-SCS Semiconductor Characterization System and Series 3400 Pulse/Pattern Generator

Literature Number: Job #2851
Application Note 26 Dec 2019
Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS
Making Ultra-Low Current Measurements with the Low-Noise Model 4200-SCS Semiconductor Characteriztion System Parametric characterization of semiconductor devices typically requires making extremely low current measurements. For MOSFET devices, the ga

Literature Number: Application Note Number 2241
Application Note 26 Dec 2019
Making I-V and C-V Measurements on Solar/Photovoltaic Cells Using the Model 4200-SCS Semiconductor Characterization System
Application Note 26 Dec 2019
Moving from Windows XP to Windows 7? Upgrade Your Model 4200-SCS
How-to Guide 26 Dec 2019
Monitoring Channel Hot Carrier (CHC) Degradation of MOSFET Devices using Keithley's Model 4200-SCS

Literature Number: Print job #2535
Application Note 26 Dec 2019
Measuring MOSFET Gate Charge with the 4200A-SCS Parameter Analyzer
This application note describes how to measure gate charge on a MOSFET based on the JEDEC Gate Charge Test Method using the 4200A-SCS Parameter Analyzer.

Literature Number: 1KW-61388-0
Application Note 26 Dec 2019
Measuring Inductance Using the 4200-CVU Capacitance-Voltage Unit
Application Note 26 Dec 2019
Performing Charge Pumping Measurements with the Model 4200-SCS Semiconductor Characterization System
Application Note 26 Dec 2019
Performing Charge Pumping Measurements with the 4200A-SCS Parameter Analyzer
This application note explains how to make charge pumping measurements using the 4200A-SCS with the optional 4225-PMU Ultra-Fast I-V Module (PMU) or 4220-PGU Pulse Generator Unit (PGU).

Literature Number: 1KW-60634-0
Application Note 26 Dec 2019
Performing Very Low Frequency Capacitance-Voltage Measurements on High Impedance Devices Using the Mode 4200-SCS Semiconductor Characterization System
Application Note 26 Dec 2019
A Local Area Network Laboratory Based on the Keithley 4200-SCS for Engineering Education in Microelectronics
Whitepaper 26 Dec 2019
Model 4200-SCS Semiconductor Characterization System
Full color brochure covering the semiconductor characterization system, Model 4200-scs.
Brochure 26 Dec 2019
Model 4200-SCS & KTEI 5.0 Software Extend Semi Characterization to Stress-Measure, Reliability Test
Cleveland, Ohio - December 11, 2003 - Keithley Instruments, Inc. (NYSE: KEI) today announced availability of its Model 4200-SCS Semiconductor Characterization System with its integral Keithley Test Environment-Interactive (KTEI) v5.0 software.
News Release 26 Dec 2019
Modifying Keithley Interlock Cable 236-ILC-3 for Use w/Cascade 12000 Series Semiautomatic Probers
Application Note 26 Dec 2019
KTEI V8.2 for the Model 4200-SCS: Characterize NVM, Measure VLF C-V, Make More Pulsed or Ultra-fast I-V Measurements in Parallel
Brochure 26 Dec 2019
Writing Prober Drivers for the Model 4200-SCS

Literature Number: Job #2361. Updated 01/07
Application Note 26 Dec 2019
Keithley Pulse Solutions
Brochure 26 Dec 2019
Discover Today's Solutions for Tomorrow's Nano Characterization Challenges
Brochure 26 Dec 2019
DC I-V and AC Impedance Testing of Organic FETs
This application note outlines how to optimize DC I-V and AC impedance measurements on OFETs using the 4200A-SCS Parameter Analyzer. Timing parameters, noise reduction, shielding, proper cabling, and other important measurement considerations for ach

Literature Number: 1KZ-61313-0
Application Note 26 Dec 2019
Using the 4200A-CVIV Multi-Switch to Make High Voltage and High Current C-V Measurements
This application note explains the implementation of the bias tee modes of the 4200A-CVIV to make high voltage C-V measurement. It assumes the reader is familiar with making C-V measurements with the Keithley 4200A-SCS using the CVIV.

Literature Number: 1KW-61356-0
Application Note 26 Dec 2019
Using the Model 4200-CVU-PWR C-V Power Package to Make High Voltage and High Current C-V Measurements with the Model 4200-SCS Semiconductor Characterization System
Application Note 26 Dec 2019
Using the Wafer Map Parameters Option with Cascade Nucleus Prober Software and the Model 4200-SCS

Literature Number: Job number 2657.
Application Note 26 Dec 2019
Improving the Measurement Speed and Overall Test Time of the Model 4200-SCS
Application Note 26 Dec 2019
Integral PC Design of Keithley Model 4200-SCS is at the Leading Edge of a New Instrumentation Trend
Technical Article 26 Dec 2019
Using the Ramp Rate Method for Making Quasistatic C-V Measurements with the Model 4200-SCS Semiconductor Characterization System
Application Note 26 Dec 2019
Gate Dielectric Capacitance-Voltage Characterization Using the Model 4200
Application Note Number 2239 Gate Dielectric Capacitance - Voltage Characterization Using the Model 4200 Semiconductor Characterization System Maintaining the quality and reliability of gate oxides is one of the most critical and challenging tasks in
Application Note 26 Dec 2019
E-Handbook Guide to Switch Considerations by Signal Type
Fact Sheet 26 Dec 2019
C-V Testing for Semiconductor Components and Devices - Applications Guide
Application Note 26 Dec 2019
C-V Characterization of MOS Capacitors Using the Model 4200-SCS Semiconductor Characterization System
Application Note 26 Dec 2019
Four-Probe Resistivity and Hall Voltage Measurements with the Model 4200-SCS

Literature Number: Rev 7.15.11 ah
Application Note 26 Dec 2019
Breathe New Life into Your 4200-SCS Parameter Analyzer
Fact Sheet 26 Dec 2019
Making van der Pauw Resistivity and Hall Voltage Measurements Using the 4200A-SCS Parameter Analyzer
This application note provides an overview of the van der Pauw and Hall effect measurement methods and how to use the built-in applications that are included with the 4200A-SCS Parameter Analyzer to perform these measurements.

Literature Number: 1KW-60641-1
Application Note 26 Dec 2019
Wafer Level Reliability Testing with the Keithley Model 4200A-SCS Parameter Analyzer
Evolving design scales and new materials are making wafer level reliability testing more critical than ever. This is also driving the demand for reliability testing and modeling much further upstream, especially into the R&D process. Instrumentma

Literature Number: 1KW-61526-0
Application Note 26 Dec 2019
Optimizing Low Current Measurements with the Model 4200-SCS Semiconductor Characterization System
Application Note 26 Dec 2019
Evaluating Oxide Reliability
Application Note Number 2240 Evaluating Oxide Reliability Using V-Ramp and J-Ramp Techniques Oxide integrity is an important reliability concern, especially for today's ULSI MOSFET devices, where oxide thickness has been scaled to a few atomic layers
Application Note 26 Dec 2019
Evaluating Hot Carrier Induced Degradation of MOSFET Devices
Application Note # 2197 Evaluating Hot Carrier Induced Degradation of MOSFET Devices With decreased MOSFET gate length, hot carrier induced degradation has become one of the most important reliability concerns.
Application Note 26 Dec 2019
1 ns Pulsing Solutions for Non-Volatile Memory Testing
Ultra-fast (<10 ns) pulsing is required to develop the newest non-volatile memory types like Flash, PCRAM, STT-RAM and others. In addition to the recommended minimum and allowable minimum pulse widths possible using the Keithley 4225-PMU Ultra-Fas

Literature Number: 1KW-61454-1
Technical Brief 26 Dec 2019
Switching Between C-V and I-V Measurements Using the 4200A-CVIV Multi-Switch and 4200A-SCS Parameter Analyzer

Literature Number: 1KW-60635-0
Application Note 26 Dec 2019
Creating External Instruments Drivers for the Model 4200-SCS

Literature Number: technical note #2661
Application Note 26 Dec 2019
Electrical Characterization of Photovoltaic Materials and Solar Cells with the Model 4200-SCS Semiconductor Characterization System
Application Note 26 Dec 2019
Electrical Characterization of Carbon Nanotube Transistors (CNT FETs) with the Model 4200-SCS Semiconductor Characterization System
Application Note 26 Dec 2019
I-V Measurements of Nanoscale Wires and Tubes with the Model 4200-SCS and Zyvex S100 Nanomanipulator

Literature Number: Job #2481
Application Note 26 Dec 2019
DC Electrical Characterization of RF Power Transistors
Application Note 26 Dec 2019
Model 4200A-SCS Clarius V1.6.1 Software

Part Number: 077132608
Manual 26 Nov 2019
Model 4200A-SCS Parameter Analyzer Reference Manual

Part Number: 4200A-901-01G_September_2019_Reference.pdf
Manual 26 Nov 2019
Modèle 4200A-SCS Liste d'Avertissements
Warnings from the QSGs, User's Manual and Reference Manual translated into French for the 4200A-SCS Other

Part Number: 077126000
Manual 26 Nov 2019
Model 4200A-SCS Clarius V1.7 Software

Part Number: 077132609
Manual 26 Nov 2019
Model 4200A Parameter Analyzer User's Manual
The Keithley Instruments Model 4200A-SCS User's Manual provides detailed product, connection, accessory, application, and Clarius+ software information. User Manual

Part Number: 4200A-900-01C
Manual 26 Nov 2019
Model 4200-SCS Semiconductor Characterization System Declassification and Security Instructions
Model 4200-SCS Semiconductor Characterization System Declassification and Security Instructions Instructions

Part Number: 077134300
Manual 26 Nov 2019
Keithley PreAmp Adapter Installation

Part Number: PA-633A
Manual 26 Nov 2019
Model 4200A-SCS Declassification and Security Instructions
Model 4200A-SCS Declassification and Security Instructions Instructions

Part Number: 077126200
Manual 26 Nov 2019
ACS Software Reference Manual

Part Number: ACS-901-01
Manual 26 Nov 2019
ACS Software Quick Start Guide

Part Number: ACS-903-01
Manual 26 Nov 2019
Model 4200A-RM Rack Mount Kit Installation Instructions
Model 4200A-RM Rack Mount Kit Installation Instructions

Part Number: 071348701
Manual 26 Nov 2019
Model 4200A-SCS Parameter Analyzer Reference Manual
The Model 4200A-SCS Parameter Analyzer Reference Manual provides detailed instruction for the 4200A-SCS.

Part Number: 4200A-901-01F
Manual 26 Nov 2019
Model 4200A-CVIV Multi-Switch User's Manual
User's manual for the 4200A CV-IV multi-switch.

Part Number: 4200A-CVIV-900-01D
Manual 26 Nov 2019
Model 4200A-SCS Semiconductor Characterization System Quick Start Guide
Model 4200A-SCS Semiconductor Characterization System Quick Start Guide Quick Start User Manual

Part Number: 4200A-903-01A
Manual 26 Nov 2019
Model 4200A-SCS Package 3 System Quick Start Guide
Model 4200A-SCS Package 3 System Quick Start Guide Quick Start User Manual

Part Number: 4200A-PK3-903-01A
Manual 26 Nov 2019
KTE Interactive V9.1 Service Pack 2 Software Release Notes & Installation Instructions
Release notes and installation instructions for KTE Interactive software for the 4200. Release Notes

Part Number: PA-895R
Manual 26 Nov 2019
Model 4210-MMPC-C Multi-Measurement Prober Cable Kit Quick Start Guide
This multi-measurement cable set is a collection of standard and custom connectors and accessories used to take I-V, C-V, and pulsed I-V measurements using a single prober cable setup. Instruction Manual

Part Number: PA-1001D
Manual 26 Nov 2019
Model 4200-Compiler Installation Instructions
4200-Compiler installation instructions for the 4200A-SCS and 4200-SCS Instructions

Part Number: PA-1030E
Manual 26 Nov 2019
ACS Basic Software Reference Manual

Part Number: ACSBASIC-901-01
Manual 26 Nov 2019
ACS Basic Software Quick Start Guide

Part Number: ACSBASIC-903-01
Manual 26 Nov 2019
Model 4200A-SCS-PK2 Parameter Analyzer Quick Start Guide
Model 4200A-SCS-PK2 Parameter Analyzer Quick Start Guide Quick Start User Manual

Part Number: 4200A-PK2-903-01A
Manual 26 Nov 2019
Models 4200-MAG-BASE, VAC-BASE, and 4225-RPM

Part Number: PA-624C
Manual 26 Nov 2019
Pulse I-V Characterization of Non-Volatile Memory Technologies

Literature Number: 1KW-60638-0
Application Note 26 Nov 2019
TECHNIQUES FOR MEASURING RESISTIVITY FOR MATERIALS CHARACTERIZATION

Literature Number: 1KW-60826-0
Application Note 26 Nov 2019
Performing Very Low Frequency Capacitance-Voltage Measurements on High Impedance Devices Using the 4200A-SCS Parameter Analyzer

Literature Number: 1KW-60644-0
Application Note 26 Nov 2019
Low Level Measurements Handbook - 7th Edition

Literature Number: 1KW-1559-0
Handbook 26 Nov 2019
Keithley Instrumentation for Electrochemical Test Methods and Applications
This application note discusses a variety of electrochemical applications, including voltammetry, low and high resistivity measurements, battery test, potentiometry, electrodeposition, electrical device characterization, and other tests that involve

Literature Number: 1KW-60158-1
Application Note 26 Nov 2019
How to Choose and Apply Source Measure Unit SMU Instruments
Application Note 26 Nov 2019
C‑V Characterization of MOS Capacitors Using the 4200A-SCS Parameter Analyzer

Literature Number: 1KW-60645-0
Application Note 26 Nov 2019
Optimizing Low Current Measurements with the 4200A-SCS Parameter Analyzer

Literature Number: 1KW-60636-0
Application Note 26 Nov 2019
Evolving Materials and Testing for Emerging Generations of Power Electronics Design
Transitioning from silicon to wide bandgap semiconductors such as silicon carbide and gallium nitride means that power module designs can be physically smaller than what came before, while also increasing MOSFET switching speed and energy efficiency.

Literature Number: 75W-61556-0
Technical Brief 26 Nov 2019
Electrical Characterization of Carbon Nanotube Transistors (CNT FETs) with the 4200A-SCS Parameter Analyzer

Literature Number: 1KW-60633-0
Application Note 26 Nov 2019
Electrical Characterization of Photovoltaic Materials and Solar Cells with the 4200A-SCS Parameter Analyzer

Literature Number: 1KW-60642-0
Application Note 26 Nov 2019
DC I-V Testing for Components and Semiconductor Devices
DC I-V measurements are the cornerstone of device and material testing. This DC I-V testing applications e-guide features a concentration of application notes on DC I-V testing methods and techniques using Keithley’s Model 4200-SCS Parameter Analyzer
Application Note 26 Nov 2019
4200-SCS KTEI V9.1 Service Pack 2
4200-SCS KTE Interactive V9.1 Service Pack 2 includes all changes from KTEI V9.1 Service Pack 1, plus additional enhancements and fixes for known bugs. This service pack is to be installed on top of either KTEI V9.1 or V9.1 Service Pack 1 software on

Part Number: 4200-KTEI-V9.1SP2
Software 12 Nov 2019
4200A-SCS Clarius+ Software Suite V1.7
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix Company, at TEK.com to upgrade the parameter analyzer. If installing on a

Part Number: 4200A-CLARIUS-V1.7
Software 12 Nov 2019
4200A-SCS Clarius+ Software Suite V1.5
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix company, at tek.com to upgrade the parameter analyzer.If installing on a per

Part Number: 4200A-CLARIUS-V1.5
Software 12 Nov 2019
4200A-SCS Clarius+ Software Suite V1.3
The 4200A-SCS Clarius+ Software Suite provides a clear, uncompromised parameter analysis for your semiconductor devices, materials, processes and more. Download the latest version of Clarius+ to stay up-to-date with the ever-growning library of ready

Part Number: 4200A-CLARIUS-V1.3
Software 12 Nov 2019
4200A-SCS Clarius+ Software Suite V1.6.1
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix Company, at TEK.com to upgrade the parameter analyzer. If installing on a

Part Number: 4200A-CLARIUS-V1.6.1
Software 12 Nov 2019
An Ultra-Fast Single Pulse (UFSP) Technique for Channel Effective Mobility Measurement

Literature Number: 1KW-60643-0
Application Note 12 Nov 2019
Touch, Test, Invent with the Next Generation Current and Voltage Source-Measure Instruments
Fact Sheet 12 Nov 2019
Resistivity Measurements of Semiconductor Materials Using the 4200A-SCS Parameter Analyzer and a Four-Point Collinear Probe

Literature Number: 1KW-60640-0
Application Note 12 Nov 2019
Simplifying MOSFET and MOSCAP Device Characterization e-Guide
This e-guide answers some common questions about making better semiconductor measurements, with a focus on DC I-V and capacitance-voltage (C-V) measurements. It also touches on more specific applications and how you can simplify making the measuremen

Literature Number: 1KW-60780-1
Brochure 12 Nov 2019
Upgrade Your 4200-SCS System and Protect Your Investment
Upgrade your 4200-SCS Parameter Analyzer to the 4200A-SCS - the industry's highest performance analyzer - and accelerate I-V, C-V, and ultra-fast pulsed I-V testing of your complex devices for materials research, semiconductor device design, process

Literature Number: 1KW-60873-1
Fact Sheet 12 Nov 2019
Using the 4200-CVU-PWR C-V Power Package to Make High Voltage and High Current C-V Measurements with the 4200A-SCS Parameter Analyzer

Literature Number: 1KW-60637-0
Application Note 12 Nov 2019
METHODS AND TECHNIQUES FOR SEMICONDUCTOR CHARACTERIZATION

Literature Number: 1KW-60825-0
Application Note 12 Nov 2019
Using the Ramp Rate Method for Making Quasistatic C-V Measurements with the 4200A-SCS Parameter Analyzer

Literature Number: 1KW-60639-0
Application Note 12 Nov 2019
Using the Model 4225-RPM Remote Amplifier/ Switch to Automate Switching Between DC I-V, C-V, and Pulsed I-V Measurements

Literature Number: 1KW-60628-0
Application Note 12 Nov 2019
TECHNIQUES FOR MEASURING RESISTIVITY FOR MATERIALS CHARACTERIZATION

Literature Number: 1KW-60826-0
Application Note 04 Jul 2019
Listen to our panel discuss three measurement applications where the properties of new materials have influenced how measurements are made. 
In this video, we show you how to quickly set up your test for making automatic I-V and C-V measurements on the Keithley 4200A-SCS Parameter Analyzer.
Get tips on improving DC I-V and capacitance voltage measurements, along with tips on performing DC pulsed tests.
This webinar presents a new process that makes characterization and parameter extraction easier and quicker. We'll be discussing the extraction of common parameters as well as which tests to run t...
Listen to our panel discuss three semiconductor measurement applications where shrinking sizes or faster speeds have changed the device measurement methods being used for the newest memory, integr...
Measuring new materials or devices? Watch how you can get insights faster-than-ever with hassle-free connections, faster test setup, and built-in test libraries and learning tools. See how to gain...