Characterizing semiconductor devices using source measure units and graphical user interfaces is a crucial part of the design process. In this webinar, you will learn how SMUs can characterize standard 2- and 3-terminal semiconductor devices and how you can use modern graphical user interfaces to perform the measurements quickly and easily. This webinar will also discuss:
• How to characterize 2- and 3-terminal devices with a Source Measure Unit
• Using common instrument and tablet interfaces to quickly set up tests
• Overcoming sources of measurement error
Duration 33m 5s
